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1

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope

Wang, P, Behan, G, Kirkland, AI, Nellist, P

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 357 KB

english, 2009

2

Three Dimensional Characterization of a Silica Hollow Sphere with an Iron Oxide Core by Annular Dark Field Scanning Confocal Electron Microscopy

Takeguchi, M, Okuda, M, Hashimoto, A, Mitsuishi, K, Shimojo, M, Zhang, X, Wang, P, Nellist, PD, Kirkland, AI

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 509 KB

english, 2010

3

Aberration Corrected Tilt Series Reconstruction

Haigh, S, Kirkland, AI, Chang, LY

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 459 KB

english, 2007

4

STM and HRTEM of Nanostructures and Metal Nanocrystals on SrTiO3 (001)

Marsh, HL, Deak, DS, Silly, F, Nellist, PD, Kirkland, AI, Castell, MR

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 930 KB

english, 2007

5

Aberration Correction and Exit Wave Reconstruction Using Tilt Azimuth Data

Kirkland, AI, Haigh, S

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 2.67 MB

english, 2009

6

Uses of a STEM Cs-Corrector in Electron Diffractive Imaging

Dwyer, C, Hartel, P, Muller, H, Haider, M, Kirkland, AI

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 191 KB

english, 2007

7

Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy

Nellist, PD, Wang, P, Behan, G, Kirkland, AI, Hashimoto, A, Shimojo, M, Mitsuishi, K, Takeguchi, M, Cosgriff, E, D'Alfonso, AJ, Allen, LJ, Findlay, SD

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 564 KB

english, 2010

8

Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes

Nellist, PD, Cosgriff, EC, Behan, G, Kirkland, AI, D'Alfonso, AJ, Findlay, SD, Allen, LJ

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 198 KB

english, 2008

9

Counting Electrons in Transmission Electron Microscopes

Moldovan, G, Li, X, Wilshaw, P, Kirkland, AI

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 195 KB

english, 2008

10

Cs-Corrected Cryo-Electron Microscopy for Biological Samples

Evans, JE, Hetherington, C, Kirkland, AI, Stahlberg, H, Browning, ND

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 542 KB

english, 2007

11

Recording low Spatial Frequencies While Maintaining Information Limit Resolution Using the TEAM I Microscope

Haigh, S, Jiang, B, Alloyeau, D, Kisielowski, C, Kirkland, AI

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 747 KB

english, 2010

12

Prospects for 3D Characterization of Materials by Aberration Corrected STEM and SCEM

Nellist, PD, Cosgriff, EC, Behan, G, Kirkland, AI

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 301 KB

english, 2007

13

Real-space Measurements of Bonding Charge Density in Aberration-corrected High Resolution Electron Microscopy

Ciston, J, Haigh, SJ, Kim, JS, Kirkland, AI, Marks, LD

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 280 KB

english, 2009

14

Processing and Aberration-Corrected Imaging of Novel Low-Dimensional Nanostructures

Nicolosi, V, Aslam, Z, Kim, J, Krivanek, OL, Chisholm, MF, Pennycook, TJ, Kirkland, AI, Grobert, N, Nellist, PD

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 683 KB

english, 2010

15

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

Hashimoto, A, Wang, P, Shimojo, M, Mitsuishi, K, Kirkland, AI, Nellist, PD, Takeguchi, M

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 773 KB

english, 2010

16

Imaging Active Sites on Platinum Catalytic Nanoparticles Using Aberration-Corrected Electron Microscope

Chang, LY, Cervera-Gontard, L, Hetherington, C, Kirkland, AI, Ozkaya, D, Dunin-Borkowski, R

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 224 KB

english, 2007

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